| M Series Test Platforms
The M Series test solutions from KVD provide a broad mix of performance for testing analog dominant devices. Through smart engineering and decades of ATE design experience, we focus on three elements in our product strategy to provide you a compelling test solution.
- Intuitive and easy to use software
- Multi-site architecture to enable better parallel test efficiencies
- High accuracy instrumentation
KVD M Series software - Focusing on the most critical element today - efficient program releases
- Accelerated new development via the KVD Apps Wizard
- Simple ASCII data structures that are easy to manage, edit and maintain
- GUI's that help manage the ASCII files and help organize information
- Lots of real time feedback via statistical reports, debug displays and trace tools
Overall, a software package that is easy to learn, easy to use and quick to delpoy. Please find more detail here.
KVD multi-site architecture - Enabling the optimized parallel test efficiencies
- Resource map enabling DUT centric multi-site code
- Trigger architecture for simultaneous source, measure and capture
- Ground sense per instrument for independent ground planes per site
- Large data bandwidth, capture and transfer via the High Speed Link (HSL) from our test head to PC
  
Please find more detailed information under the KVD Products section to the left.
KVD Instrumentation - Designed for higher analog accuracy, throughput and parallel test
- 16-24 bit converters used on our VI's, voltmeters and AC resources for higher accuracy
- Ground sense per instrument reduces site to site correlation issues for power management
- FPGA controller per instrument optimizes setup, measurements and throughput
We have many years of ATE instrument design within our company. Please find more detail here.
Please contact KVD for literature and specifications.
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