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Linear and Power Management Solutions
Linear and Power Management devices require a mix of low and higher power VI's, digital control and time measurement. This market is a good candidate for parallel test as volumes and packages favor multi-site cost models. Test times are typically short yet integration and lack of advanced analog DFT challenge MCM and SIP products.
KVD have a solid range of instruments that address today's test challenges:
- VI's for power supplies, dynamic loads, bias pins, and power
- 24 bit voltmeters for very accurate measurements : Vref, Vbandgap, Vout, Vbias / Ground trimming
- Digital pins for I2C, SMbus, SPIbus, 1 and 2 wire interfaces, servo trim, clocking and register control
- Timing access via the digital or directly for switch time, frequency, prop delay, rise and fall time

KVD keeps Analog multi-site simple:
- Analog ground sense per instrument so you can have ground planes and resources per site
- Simple C++ code where single and multi-site programs are the same - no need for conversions
- Software tools that show per site debugging
- Statistical data analysis tools per site to help with site to site correlation
- FPGA per card to manage multi-site, triggers, sampling etc.
  
Please contact our KVD applications team to discuss your test needs.
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